The portatil dental sensor uses silicon-based chips instead of the traditional material, cesium iodide (CsI), avoiding image blurring or performance deterioration. Image capture achieved in an average of 3 seconds, USB direct connection, what you see is what you get, instant results, rapid decision-making.

The Portable X-Ray Stress Analyzer is designed for non-destructive measurement of surface residual stress in metal components. Using X-ray diffraction, Cosα analysis, and a 2D area detector, the system captures Debye ring data in a single exposure and provides quantitative residual stress results for field inspection and engineering evaluation.